欧亚国际

来自德国的科学家，在新出版图书“更可持续作物生产的植物表型研究进展（pp.123-150）”详细介绍了CT计算机断层扫描系统以及其在作物表型组学研究中的应用。通常CT系统用于种子表型组学结构研究以及根系表型组学土壤中根系结构研究。

摘要

本章介绍了用于作物表型分析的CT系统的技术部分。首先，描述并解释了所有硬件组件，展示了它们是如何用于表型目的。然后，展示了不同的系统设置和获取CT数据集的方法。此外，还讨论了使用专门的分割算法对生成的数据进行后处理。对于地上和地下表型研究应用，展示了两个不同的案例，展现了CT在作物表型分析中的应用。通过本章学习，读者将熟练地为其个人表型应用选择CT系统，并了解未来的发展可能如何影响当前系统的通量或分辨率。

Advances in the use of X-ray computed tomography in crop phenotyping

DOI:10.19103/AS.2022.0102.06

In book: Advances in plant phenotyping for more sustainable crop production (pp.123-150)

Abstract

This chapter addresses the technological parts of a CT system used for crop phenotyping. First, all of the hardware components are described and explained. Thus, it is shown how they are utilized for phenotyping purposes. After that, different system setups and ways of acquiring a CT dataset are shown. Additionally, the post processing of the generated data using specialized algorithms for segmentation is discussed. For above- and belowground phenotyping applications two different examples are shown to present the utilization of CT for crop phenotyping. With this chapter, the reader will be proficient in choosing a CT system for their individual phenotypic application and will know how future advances might affect the throughput or the resolution of the current systems.